JPH0717025Y2 - Ic試験装置 - Google Patents

Ic試験装置

Info

Publication number
JPH0717025Y2
JPH0717025Y2 JP14671189U JP14671189U JPH0717025Y2 JP H0717025 Y2 JPH0717025 Y2 JP H0717025Y2 JP 14671189 U JP14671189 U JP 14671189U JP 14671189 U JP14671189 U JP 14671189U JP H0717025 Y2 JPH0717025 Y2 JP H0717025Y2
Authority
JP
Japan
Prior art keywords
rail
distribution
supplied
buffer
supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP14671189U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0385583U (en]
Inventor
義仁 小林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP14671189U priority Critical patent/JPH0717025Y2/ja
Publication of JPH0385583U publication Critical patent/JPH0385583U/ja
Application granted granted Critical
Publication of JPH0717025Y2 publication Critical patent/JPH0717025Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP14671189U 1989-12-20 1989-12-20 Ic試験装置 Expired - Lifetime JPH0717025Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14671189U JPH0717025Y2 (ja) 1989-12-20 1989-12-20 Ic試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14671189U JPH0717025Y2 (ja) 1989-12-20 1989-12-20 Ic試験装置

Publications (2)

Publication Number Publication Date
JPH0385583U JPH0385583U (en]) 1991-08-29
JPH0717025Y2 true JPH0717025Y2 (ja) 1995-04-19

Family

ID=31693258

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14671189U Expired - Lifetime JPH0717025Y2 (ja) 1989-12-20 1989-12-20 Ic試験装置

Country Status (1)

Country Link
JP (1) JPH0717025Y2 (en])

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5130552B1 (ja) * 2012-02-14 2013-01-30 株式会社ミヤザワ パン片コンベア装置

Also Published As

Publication number Publication date
JPH0385583U (en]) 1991-08-29

Similar Documents

Publication Publication Date Title
KR100524632B1 (ko) 테스트-번인 장치, 그 테스트-번인 장치를 이용한 인라인시스템 및 그 시스템을 이용한 테스트 방법
DE19523969C2 (de) Bausteintransportvorrichtung und Verfahren zum wiederholten Testen von Bausteinen für IC-Handhabungseinrichtung
KR20070058996A (ko) Soc 파이프라인 테스터, 파이프라인 테스트 모듈 및파이프라인 테스트 방법
US20070018673A1 (en) Electronic component testing apparatus
JPH0717025Y2 (ja) Ic試験装置
JP2000088918A (ja) Icハンドラ
US6765378B2 (en) Test handler apparatus for SMD (surface mount devices), BGA (ball grid arrays) and CSP (chip scale packages)
US6783316B2 (en) Apparatus and method for testing semiconductor devices
JPH0717026Y2 (ja) Ic試験装置
JPH08170976A (ja) 半導体試験装置用ハンドラ機構
JP3316075B2 (ja) Ic試験装置用オートハンドラ
US7501809B2 (en) Electronic component handling and testing apparatus and method for electronic component handling and testing
US6202858B1 (en) Method for sorting IC-components
JPH02189946A (ja) 半導体集積回路装置のテスト方法
JPS61217424A (ja) 分類装置
JPS58168247A (ja) 選別シュ−ト装置
JPS63166240A (ja) 電子部品の分類装置
US20160178693A1 (en) Sequential access assembly strip test adapter
DE10297714T5 (de) Prüfgerät für elektronische Bauelemente
US6448796B1 (en) Selective netlist to test fine pitch multi-chip semiconductor
JPH0712948Y2 (ja) 部品試験装置
JPS61217426A (ja) 合流装置
Tsui In-situ testability design (ISTD)—A new approach for testing high-speed LSI/VLSI logic
KR20100108612A (ko) 전자부품 이재장치 및 이를 구비한 전자부품 시험장치
JP2509632Y2 (ja) Ic試験用搬送装置

Legal Events

Date Code Title Description
R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term